Statistical SPICE Modeling Using Backward Propagation of Variance (BPV)

February 16, 2012
Interschool Lab (CEPSR 750)
Hosted by: Columbia Integrated System Laboratory
Speaker: Dr. Colin McAndrew (Freescale Semiconductor, Inc.)


A key factor in IC design is to be able to determine the expected manufacturing variations that will arise in key measures of the electrical performance of circuits. This requires accurate statistical circuit simulation models. The different types of statistical models that are required for different types of statistical circuit analyses will be reviewed (including distributional models, corner models, and mismatch models), and the advantages and disadvantages of common approaches to generating these models will be discussed. The backward propagation of variance (BPV) technique will be covered in detail, showing that it almost "cheats" by force-fitting a model to give the desired results. Extension to handle explicit fitting of correlations will be covered, and it will be shown that circuit variations, as well as device distributions, can be included in the BPV modeling process.

Speaker Biography

Colin McAndrew received the Ph.D. and M.A.Sc. degrees in Systems Design Engineering from the University of Waterloo, Waterloo, Ontario, Canada, and the B.E. (Hons) degree in Electrical Engineering from Monash University, Melbourne, Victoria, Australia. From 1987 to 1995 he was at AT&T Bell Laboratories, Allentown PA. Since 1995 he has been with Freescale Semiconductor (formerly Motorola), in Tempe AZ. His work is primarily on compact and statistical modeling and characterization for circuit simulation, for MOS transistors, bipolar transistors, and passives, and he has been a primary advocate of the use of Verilog-A and compilers for compact modeling. He was a recipient of the Ian Langlands Medal from the Institute of Engineers of Australia in 1978, best paper awards for ICMTS in 1993 and CICC in 2002, and the BCTM Award in 2005. He is a Fellow of the IEEE, was an editor of the IEEE Transactions on Electron Devices, and is or has been on the technical program committees for the IEEE BCTM, ICMTS, CICC, and BMAS conferences.

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