IEEE EDS/SSCS Distinguished Lecture: Electrostatic Discharge (ESD) Challenges in Silicon Nanowire Technology
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Date: 01-25-2010
Start Time:
10:00am
End Time: 11:00am
Speaker: Dr. Juin J. Liou
, Pegasus Distinguished Professor, University of Central Florida
Location: Room 414, Schapiro/CEPSR
Hosted by:
Prof. Ioannis Kymissis
This is an "IEEE SSCS Distinguished Lecture" organized by the New York EDS/SSCS Chapter.
Speaker
Dr. Juin J. Liou
Pegasus Distinguished Professor, University of Central Florida
Chang Jiang Scholar Endowed Professor, Ministry of Education, China
Cao Guang-Biao Endowed Professor, Zhejiang University, China
Chang Gung Endowed Professor, Chang Gung University, Taiwan
Stanford Synchrotron Radiation Lightsource
SLAC National Accelerator Laboratory
Abstract
Electrostatic discharge (ESD) is a process in which a finite
amount of charge is transferred from one object (i.e., human body) to
the other (i.e., microchip).
This process can result in a very high current
passing through the microchip within a very short period of time, and
more than 35% of chip damages can be attributed to such an event. As
such, designing robust on-chip ESD structures to protect microchips
against the ESD stress is a high priority in the semiconductor
industry. The continuing scaling of CMOS technology makes the
ESD-induced failures even more prominent, and one can predict with
certainty that the availability of effective and robust ESD protection
solutions will be a critical component to the success of the deep
sub-micron technology advancement.
An overview on the ESD sources, models, protection
schemes, and testing will first be given in this talk. This is
followed by the investigation of ESD robustness of the advanced Si
nanowire devices. Finally, the ESD challenges in Si nanowire
technology will be addressed and discussed.
Speaker's Bio
degrees in electrical engineering from the University of Florida,
Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined
the Department of Electrical and Computer Engineering at the
University of Central Florida (UCF), Orlando, Florida where he is now
the Pegasus Distinguished Professor and UCF-Analog Devices Fellow. His
current research interests are Micro/nanoelectronics computer-aided
design, RF device modeling and simulation, and electrostatic discharge
(ESD) protection design and simulation.
Dr. Liou holds 5 U.S. patents (2 more filed and pending), and has
published 8 books, more than 220 journal papers (including 14 invited
articles), and more than 180 papers (including 70 keynote or invited
papers) in international and national conference proceedings. He has
been awarded more than $9.0 million of research contracts and grants
from federal agencies (i.e., NSF, DARPA, Navy, Air Force, NASA, NIST),
state government, and industry (i.e., Semiconductor Research Corp.,
Intel Corp., Intersil Corp., Lucent Technologies, Alcatel Space,
Conexant Systems, Texas Instruments, Fairchild Semiconductor, National
Semiconductor, Analog Devices, RF Micro Device, Lockheed Martin), and
has held consulting positions with research laboratories and companies
in the United States, China, Japan, Taiwan, and Singapore. In
addition, Dr. Liou serves as a technical reviewer for various journals
and publishers, general chair or technical program chair for a large
number of international conferences, and regional editor (in USA,
Canada and South America) for the Microelectronics Reliability
journal.
Dr. Liou received ten different awards on excellence in teaching
and research from the University of Central Florida (UCF) and six
different awards from the IEEE Electron Device Society. Among them, he
was awarded the UCF Pegasus Distinguished Professor (2009) – the
highest honor bestowed to a faculty member at UCF, UCF Distinguished
Researcher Award (four times: 1992, 1998, 2002, 2009), UCF Research
Incentive Award (two times: 2000, 2005), UCF Trustee Chair Professor
(2002), and IEEE Joseph M. Biedenbach Outstanding Engineering Educator
Award in 2004 for his exemplary teaching, research, and international
collaboration. His other honors are Fellow of Institute of Engineering
and Technology, Fellow of Singapore Institute of Manufacturing
Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of
IEEE Electron Devices Society (EDS), and Distinguished Lecturer of
National Science Council. He holds several honorary professorships,
including Chang Jiang Scholar Endowed Professor of Ministry of
Education, China – the highest honorary professorship in China, NSVL
Distinguished Professor of National Semiconductor Corp., USA, Chang
Gung Endowed Professor of Chang Gung University, Taiwan, Chunhui
Eminent Scholar of Peking University, China, Cao Guang-Biao Endowed
Professor of Zhejiang University, China, Honorary Professor of Xidian
University, China, Consultant Professor of Huazhong University of
Science and Technology, China, and Courtesy Professor of Shanghai Jiao
Tong University, China. Dr. Liou was a recipient of U.S. Air Force
Fellowship Award and National University Singapore Fellowship Award.
Dr. Liou served as the IEEE EDS Vice-President for
Regions/Chapters, IEEE EDS Treasurer, IEEE EDS Finance Committee
Chair, IEEE EDS Administrative Committee Elected Member, and IEEE EDS
Educational Activities Committee Member.