Technology Innovation and New Capabilities in Scanning Probe Microscopy
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Date: 05-24-2006
Start Time:
11:00am
End Time: 12:00pm
Speaker: Thomas Mueller
From:
Veeco Applications, Santa Barbara, CA
Location: 414 Schapiro/CEPSR
Hosted by:
Center for Integrated Science
Abstract:
Ever since the invention of the scanning tunneling microscope, the growing versatility of scanning probe microscopy (SPM) has been rich with examples of technological innovations driving scientific progress. This presentation will highlight advanced imaging modes and other new capabilities opened up with the recent introduction of new controller architectures and scanner geometries by the SPM market leader. Imaging modes expanding realspace nanoscale characterization beyond topography have played an important role in the expansion of SPM applications. While phase imaging has become a standard tool for nanoscale mechanical characterization, the combination of force feedback with electrical measurements has allowed SPM to play an important role in the characterization of nanoscale electrical devices. Examples of new capabilities that will be discussed include harmonic imaging and high-speed data capture, giving access to realtime cantilever dynamics and allowing the deconvolution of material properties contributing to probe sample interactions. Electrical imaging modes and associated single-point spectroscopies have been augmented through the combination with a novel feedback mechanism and low-noise position sensors, expanding opportunities for electrical characterization of delicate samples such as thin polymer films and loosely bound carbon nanotubes.