February 1, 2013
Hosted by: IEEE New York EDS/SSCS Chapter
Speaker: Prof. Gabriel Rebeiz , Wireless Communications Industry Chair Professor (University of California, San Diego)
The fundamental concepts of radiometers (passive imaging) and imaging arrays (active imaging) will be covered. This includes the definition of responsivity, noise-equivalent power (NEP), Dicke switching and 1/f noise, integration time and NEDT, coupling efficiency especially when using on-chip antennas, coupling efficiency to a plane wave or to an imaging system, will be first presented. The talk will then cover some of the latest chips developed by academia and industry at 94-160 GHz (radiometers), and 160-800 GHz detectors and active imaging arrays using SiGe, CMOS and advanced CMOS SOI nodes.
Prof. Gabriel Rebeiz is the Wireless Communications Industry Chair Professor at the University of California, San Diego. He is an IEEE Fellow, an NSF Presidential Young Investigator, an URSI Koga Gold Medal Recipient, IEEE MTT 2003 Distinguished Young Engineer, and is the recipient of the IEEE MTT 2000 Microwave Prize, the IEEE MTT 2010 Distinguished Educator Award and the IEEE Antennas and Propagation 2011 John D. Kraus Antenna Award. He is also the recipient of the 1998 Amoco Teaching Award given to the best undergraduate teacher at the University of Michigan, and the 2008 Jacobs ECE Teacher of the Year Award at UCSD. His group has lead the development of complex RFICs for phased array applications from X-band to W-band, culminating recently in wafer-scale integration with high efficiency on-chip antennas. His phased array work is now used by most companies developing complex communication and radar systems. He has graduated 50 PhD students and 16 post-doctoral fellows, and currently leads a group of 20 PhD students in mm-wave RFIC, planar mm-wave antennas and terahertz systems, microwave circuits, RF MEMS, tunable networks, and is the Director of the UCSD/DARPA Center on RF MEMS Reliability and Design Fundamentals.