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liuw:metric

Steven C. H. Hoi, Wei Liu, Shih-Fu Chang. Semi-Supervised Distance Metric Learning for Collaborative Image Retrieval. In IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR), Anchorage, Alaska, USA, June 2008.

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Abstract

Typical content-based image retrieval (CBIR) solutions with regular Euclidean metric usually cannot achieve satisfactory performance due to the semantic gap challenge. Hence, relevance feedback has been adopted as a promising approach to improve the search performance. In this paper, we propose a novel idea of learning with historical relevance feedback log data, and adopt a new paradigm called ˇ°Collaborative Image Retrievalˇ± (CIR). To effectively explore the log data, we propose a novel semi-supervised distance metric learning technique, called ˇ°Laplacian Regularized Metric Learningˇ± (LRML), for learning robust distance metrics for CIR. Different from previous methods, the proposed LRML method integrates both log data and unlabeled data information through an effective graph regularization framework. We show that reliable metrics can be learned from real log data even they may be noisy and limited at the beginning stage of a CIR system. We conducted extensive evaluation to compare the proposed method with a large number of competing methods, including 2 standard metrics, 3 unsupervised metrics, and 4 supervised metrics with side information

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Wei Liu
Shih-Fu Chang

BibTex Reference

@InProceedings{liuw:metric,
   Author = {Hoi, Steven C. H. and Liu, Wei and Chang, Shih-Fu},
   Title = {Semi-Supervised Distance Metric Learning for Collaborative Image Retrieval},
   BookTitle = {IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR)},
   Address = {Anchorage, Alaska, USA},
   Month = {June},
   Year = {2008}
}

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