May 23, 2013
Location: Interschool Lab (750 CEPSR)
Hosted by: Prof. Ken Shepard
Speaker: Nitin Rajan , Ph.D. candidate (Dept. of Applied Physics, Yale University)
In this talk, I will discuss our experiments on applying noise spectroscopy to silicon NWFETs with the goal of understanding and improving the detection limit of such devices. Using low frequency noise measurements and modeling, we are able to compare different devices/material systems and quantify the effect on device performance of different process parameters. We also consider the effects of temperature on the noise generating mechanism and investigate the fundamental origin of 1/f noise in these devices.